论文标题

Weyl Semimetal NBA中表面主导的电导缩放

Surface-dominated conductance scaling in Weyl semimetal NbAs

论文作者

Kumar, Sushant, Tu, Yi-Hsin, Sheng, Luo, Lanzillo, Nicholas A., Chang, Tay-Rong, Liang, Gengchiau, Sundararaman, Ravishankar, Lin, Hsin, Chen, Ching-Tzu

论文摘要

在半学中,由非平凡的带结构拓扑产生的受保护的表面状态可能会在计算,内存,互连,传感和通信中实现新的设备功能。这需要对纳米级拓扑半学的表面状态运输有基本的了解。在这里,我们研究了典型的拓扑半学NBA中的量子运输,以评估这类材料在高度缩放的综合电路中超越CU互连的潜力。使用密度函数理论(DFT),结合非平衡绿色功能(NEGF)计算,我们表明,NBAS膜中的抗性 - 区域RA产物在纳米尺度下随厚度的降低而降低,与理想CU膜中几乎恒定的RA产物相反。这种异常的缩放尺度源自不成比例的表面传导状态,在NBAS薄膜中占据弹道电导率高达70%。我们还表明,即使存在表面缺陷的存在,这种有利的RA缩放率仍然存在,与RA在存在表面缺陷的情况下,RA随着传统金属(例如CU)的厚度的减小而急剧增加。这些结果强调了NBA等拓扑半学作为未来后端(BEOL)互连金属的希望。

Protected surface states arising from non-trivial bandstructure topology in semimetals can potentially enable new device functionalities in compute, memory, interconnect, sensing, and communication. This necessitates a fundamental understanding of surface-state transport in nanoscale topological semimetals. Here, we investigate quantum transport in a prototypical topological semimetal NbAs to evaluate the potential of this class of materials for beyond-Cu interconnects in highly-scaled integrated circuits. Using density functional theory (DFT) coupled with non-equilibrium Green's function (NEGF) calculations, we show that the resistance-area RA product in NbAs films decreases with decreasing thickness at the nanometer scale, in contrast to a nearly constant RA product in ideal Cu films. This anomalous scaling originates from the disproportionately large number of surface conduction states which dominate the ballistic conductance by up to 70% in NbAs thin films. We also show that this favorable RA scaling persists even in the presence of surface defects, in contrast to RA sharply increasing with reducing thickness for films of conventional metals, such as Cu, in the presence of surface defects. These results underscore the promise of topological semimetals like NbAs as future back-end-of-line (BEOL) interconnect metals.

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