论文标题
MEG II实验中的辐射损伤对MPPC降解MPPC的VUV敏感性降解降解的研究
Study on degradation of VUV-sensitivity of MPPC for liquid xenon scintillation detector by radiation damage in MEG II experiment
论文作者
论文摘要
在MEG II实验中，液体XENON伽马射线检测器使用多像素光子计数器（MPPC），这些光子计数器（MPPC）在高强度的muon光束环境下对真空紫外线（VUV）光敏感。在检测器使用梁的调试阶段，发现光子检测效率（PDE）的VUV光的显着降解，而PDE中的降解效率则降低了可见光的降解。这意味着辐射损伤位于MPPC的表面，其中传入的VUV光子会产生电子孔对。还发现，PDE可以通过热退火恢复到原始水平。
In the MEG II experiment, the liquid xenon gamma-ray detector uses Multi-Pixel Photon Counters (MPPC) which are sensitive to vacuum ultraviolet (VUV) light under a high-intensity muon beam environment. In the commissioning phase of the detector with the beam, a significant degradation in the photon detection efficiency (PDE) for VUV light was found, while the degradation in the PDE for visible light was much less significant. This implies that the radiation damage is localized to the surface of the MPPC where incoming VUV photons create electron-hole pairs. It was also found that the PDE can recover to the original level by thermal annealing.
