论文标题
在原子分辨率扫描透射电子显微镜中的插条
Interlacing in atomic resolution scanning transmission electron microscopy
论文作者
论文摘要
由于多种原因，在扫描传输电子显微镜中需要快速帧速率：控制电子束剂量，捕获原位事件或减少扫描畸变的外观。尽管有几种策略来增加帧速率，但许多影响图像质量或需要对高级扫描硬件进行投资。在这里，我们提出了一种交错的成像方法，以最小化图像质量的损失，并以更快的框架速率在许多现有的扫描控制器上实现。我们进一步证明，与其他当代方法相比，我们的交错方法为给定电子剂量提供了最佳的应变精度。
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appearance of scan distortions. Whilst several strategies exist for increasing frame-rates, many impact image quality or require investment in advanced scan hardware. Here we present an interlaced imaging approach to achieve minimal loss of image quality with faster frame-rates that can be implemented on many existing scan controllers. We further demonstrate that our interlacing approach provides the best possible strain precision for a given electron dose compared with other contemporary approaches.
