了解用SIPM的电荷颗粒直接检测

论文标题

了解用SIPM的电荷颗粒直接检测

Understanding the direct detection of charged particles with SiPMs

论文作者

Carnesecchi, F., Vignola, G., Agrawal, N., Alici, A., Antonioli, P., Arcelli, S., Bellini, F., Cavazza, D., Cifarelli, L., Colocci, M., Durando, S., Ercolessi, F., Ficorella, A., Fraticelli, C., Garbini, M., Giacalone, M., Gola, A., Hatzifotiadou, D., Jacazio, N., Margotti, A., Malfattore, G., Nania, R., Noferini, F., Paternoster, G., Pinazza, O., Preghenella, R., Rath, R., Ricci, R., Rignanese, L., Rubini, N., Sabiu, B., Scapparone, E., Scioli, G., Strazzi, S., Tripathy, S., Zichichi, A.

论文摘要

在本文中，据报道，SIPM传感器对带电颗粒通过的响应的增加主要与保护层中产生的Cherenkov光有关。已经研究了具有不同保护层的传感器的响应和时序特性。

In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.

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