论文标题
分层1T-MX2(M = HF,ZR,SN; X = S,SE)晶体中的应力调整光学转变
Stress-Tuned Optical Transitions in Layered 1T-MX2 (M= Hf, Zr, Sn; X= S, Se) Crystals
论文作者
论文摘要
在外部施加应力下的光学测量值使我们能够通过比较从实验和理论计算获得的光峰的压力演化来研究材料的电子结构。我们使用密度功能理论研究了所选MX2化合物的热力学稳定1T多型的应力诱导的电子结构变化(M = HF,Zr,SN; X = S,SE)。我们证明,所考虑的1T-MX2材料是带有带隙的间接特征的半导体,无论使用改良的Becke-Johnson潜力所预测的使用压力。我们确定极端带和接近费米水平的带状区域之间的直接带间跃迁的能量。通常,所研究的过渡是光学活跃的,表现出光的光内极化。最后,我们通过确定线性压力系数来量化其在外部静水,单轴和双轴应力下的能量趋势。通常,获得负压系数,这意味着带隙的狭窄。半导体到金属的过渡是在静水压力下预测的。我们从相关电子带的轨道组成方面讨论了这些趋势。此外,我们证明了HFS2和HFSE2吸收边的测得的压力系数与我们的预测完全一致。提供了包含光学特征的全面且易于解释的表,以构成未来测量中光峰的基础。
Optical measurements under externally applied stresses allow us to study the materials' electronic structure by comparing the pressure evolution of optical peaks obtained from experiments and theoretical calculations. We examine the stress-induced changes in electronic structure for the thermodynamically stable 1T polytype of selected MX2 compounds (M=Hf, Zr, Sn; X=S, Se), using the density functional theory. We demonstrate that considered 1T-MX2 materials are semiconducting with indirect character of the band gap, irrespective to the employed pressure as predicted using modified Becke-Johnson potential. We determine energies of direct interband transitions between bands extrema and in band-nesting regions close to Fermi level. Generally, the studied transitions are optically active, exhibiting in-plane polarization of light. Finally, we quantify their energy trends under external hydrostatic, uniaxial, and biaxial stresses by determining the linear pressure coefficients. Generally, negative pressure coefficients are obtained implying the narrowing of the band gap. The semiconducting-to-metal transition are predicted under hydrostatic pressure. We discuss these trends in terms of orbital composition of involved electronic bands. In addition, we demonstrate that the measured pressure coefficients of HfS2 and HfSe2 absorption edges are in perfect agreement with our predictions. Comprehensive and easy-to-interpret tables containing the optical features are provided to form the basis for assignation of optical peaks in future measurements.