论文标题

基准测试多量门 - I:计量方面

Benchmarking multi-qubit gates -- I: Metrological aspects

论文作者

Madhusudhana, Bharath Hebbe

论文摘要

大量子系统的准确和精确控制对于在量子设备上实现实际优势至关重要。因此,量子计算机中的硬件错误基准测试引起了极大的关注。现有的数字量子计算机的基准涉及在大量量子电路上平均全球保真度,因此不适合模拟量子操作中使用的特定多数门。此外,对于某些针对多量门门和模拟设备的应用程序(例如,对多体物理学的研究),平均全球忠诚度并不是某些特定于多量门和模拟设备的应用程序的最佳人数。在这本两部分的论文中,我们基于操作的choi矩阵,开发了适用于多量量子门的新的合格。在第一部分中,我们开发了一个有效的可扩展协议,以完全表征降低的CHOI矩阵。我们在降低的CHOI矩阵的测量中确定了两个采样误差的来源,我们表明采样误差的收敛速率是有基本的限制,类似于标准量子限制和海森贝格限制。采样误差的缓慢收敛速率意味着我们需要大量的实验镜头。我们使用量子信息争夺制定协议,例如在无序系统中观察到,例如,在状态准备时加快采样误差的收敛速率,我们使用挤压和纠缠的初始状态开发协议,以增强测量时采样误差的收敛速率,从而在计量学方面增强了进程协议的减少。

Accurate and precise control of large quantum systems is paramount to achieve practical advantages on quantum devices. Therefore, benchmarking the hardware errors in quantum computers has drawn significant attention lately. Existing benchmarks for digital quantum computers involve averaging the global fidelity over a large set of quantum circuits and are therefore unsuitable for specific multi-qubit gates used in analog quantum operations. Moreover, average global fidelity is not the optimal figure-of-merit for some of the applications specific to multi-qubit gates and analog devices , such as the study of many-body physics, which often use local observables. In this two-part paper, we develop a new figure-of-merit suitable for multi-qubit quantum gates based on the reduced Choi matrix of the operation. In the first part, we develop an efficient, scalable protocol to completely characterize the reduced Choi matrix. We identify two sources of sampling errors in measurements of the reduced Choi matrix and we show that there are fundamental limits to the rate of convergence of the sampling errors, analogous to the standard quantum limit and Heisenberg limit. A slow convergence rate of sampling errors would mean that we need a large number of experimental shots. We develop protocols using quantum information scrambling, which has been observed in disordered systems for e.g., to speed up the rate of convergence of the sampling error at state preparation Moreover, we develop protocols using squeezed and entangled initial states to enhance the convergence rate of the sampling error at measurement, which results in a metrologically enhanced reduced process tomography protocol.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源