论文标题
深色物质子结构会影响基于XENON的直接检测实验中的暗物质电子散射
Dark matter substructures affect dark matter-electron scattering in xenon-based direct detection experiments
论文作者
论文摘要
最近的天空调查发现了大量出色的子结构。这些出色的子结构很可能有暗物质（DM）对应物。我们研究了双相XENON实验中DM子结构对电子后坐力（ER）直接检测率（DD）速率的含义。我们利用了Lamost调查的结果，并在分析中考虑了一些基准子结构。假设这些子结构构成了局部DM密度的$ \ sim 10 \％$，我们研究了考虑一个KG年度暴露，1、2和3个电子阈值的DM电子散射横截面的发现极限。通过这种暴露和阈值，可以观察到当前允许的参数空间所考虑的DM子结构的效果。我们还探讨了这些实验在解决DM子结构部分方面的敏感性。在所有考虑的情况下，我们都会观察到具有质量$ \ MATHCAL {o}（10）\的DM，$ MEV在解决子结构分数方面具有更好的前景，而$ \ Mathcal {O}（100）（100）\，$ MEV Scale Scale DM。我们还发现，在当前允许的DM电子散射横截面。这些实验可以解决$ \ mathcal {o}（10）\，$ MEV DM质量，具有一个电子阈值的$ \ MATHCAL {O}（10）\，以良好的准确性解决子结构分数（前提是对局部DM密度的不可忽略贡献）。
Recent sky surveys have discovered a large number of stellar substructures. It is highly likely that there are dark matter (DM) counterparts to these stellar substructures. We examine the implications of DM substructures for electron recoil (ER) direct detection (DD) rates in dual phase xenon experiments. We have utilized the results of the LAMOST survey and considered a few benchmark substructures in our analysis. Assuming that these substructures constitute $\sim 10\%$ of the local DM density, we study the discovery limits of DM-electron scattering cross sections considering one kg-year exposure and 1, 2, and 3 electron thresholds. With this exposure and threshold, it is possible to observe the effect of the considered DM substructure for the currently allowed parameter space. We also explore the sensitivity of these experiments in resolving the DM substructure fraction. For all the considered cases, we observe that DM having mass $\mathcal{O}(10)\,$MeV has a better prospect in resolving substructure fraction as compared to $\mathcal{O}(100)\,$MeV scale DM. We also find that within the currently allowed DM-electron scattering cross-section; these experiments can resolve the substructure fraction (provided it has a non-negligible contribution to the local DM density) with good accuracy for $\mathcal{O}(10)\,$MeV DM mass with one electron threshold.
