论文标题

伦敦电子辐射的BA1-XKXFE2AS2单晶的渗透深度

London penetration depth of electron-irradiated Ba1-xKxFe2As2 single-crystals

论文作者

Gierlowski, P., Camargo, B. Cury, Abaloszewa, I., Abaloszew, A., Jaworski, M., Cho, K., Prozorov, R., Konczykowski, M.

论文摘要

我们已经使用两种不同的实验技术来表征电子辐射的BA1-XKXFE2AS2(x = 0.53)单晶:磁化测量和微波测量。在2.5 MEV电子辐照过程之前和2.5 MEV电子辐照过程之前已经测量了晶体。辐照后,它以多个步骤(在90°C至180°C之间)退火,并在每个退火步骤后进行测量。大多数微波测量是利用TE011和TM110模式的铜腔进行的,从而确定伦敦穿透深度变化ΔλAB(t)和δλC(t)和δλC(t),即垂直且与样品C轴平行。得出基于扰动理论的适当方程式,用于计算矩形棱镜几何形状的渗透深度变化Δλab和Δλc。该样品显示其TC的完全恢复,但是观察到的ΔλC和ΔλAB的行为不是单调与退火温度,在120度处显示至少为ΔλC和δλAB。在磁极光上测量结果证实了这一发现,除了验证了样品均匀的均匀缺陷外,还没有可见的均匀缺陷。获得了单晶,并计算了伦敦穿透深度λab(0)。

We have characterized an electron-irradiated Ba1-xKxFe2As2 (x = 0.53) single-crystal using two different experimental techniques: magneto-optic measurements and microwave measurements. The crystal has been measured before as well as after the 2.5 MeV electron irradiation process. After irradiation it was annealed in a number of steps, between 90 deg C and 180 deg C, and measured after each annealing step. Most microwave measurements were performed by means of a copper cavity, taking advantage of the TE011 and TM110 modes, allowing for the determination of the London penetration depths changes δλab(T) and δλc(T), i.e. perpendicular and parallel to the sample c-axis. Appropriate equations, based on perturbation theory, were derived to calculate the penetration depths changes δλab and δλc for a rectangular prism geometry. The sample showed a full recovery of its Tc, however the observed behavior of δλc and δλab was not monotonic vs annealing temperature, displaying a minimum of δλc and δλab at 120 deg C. This finding was confirmed by magneto-optic measurements, where besides verifying the sample uniformity and the absence of visible defects, the lower critical field Hc1 of the Ba1-xKxFe2As2 single-crystal was obtained and the London penetration depth λab(0) was calculated.

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