论文标题
在光谱显微镜检查中扫描降低剂量和更快的测量
Undersampling Raster Scans in Spectromicroscopy for reduced dose and faster measurements
论文作者
论文摘要
光谱分析和微观技术的组合在许多科学研究的学科中都使用，包括材料科学，化学和生物学。特别是X射线光谱显微镜是一种强大的工具，用于研究微型和纳米尺度上的化学状态分布。固定光束后，通常会通过探测器连续运动将样品栅格栅格，并以固定的时间间隔收集一系列多模式数据。 由于正在研究的面积/体积，因此在某些领域的应用在某些领域的应用受到限制：要么收集数据；以及由于测量过程中吸收的剂量而导致的材料降解。在这项工作中，我们提出了一种新颖的方法，用于减少栅格数据来减少剂量和扫描时间。这是通过在扫描中跳过行并使用低级矩阵完成来重建X射线光谱测量值来实现的。新方法是可靠的，可以减少采样的X 5-6。说明了根据实际数据获得的实验结果。
Combinations of spectroscopic analysis and microscopic techniques are used across many disciplines of scientific research, including material science, chemistry and biology. X-ray spectromicroscopy, in particular, is a powerful tool used for studying chemical state distributions at the micro and nano scales. With the beam fixed, a specimen is typically rastered through the probe with continuous motion and a range of multimodal data is collected at fixed time intervals. The application of this technique is limited in some areas due to: long scanning times to collect the data, either because of the area/volume under study or the compositional properties of the specimen; and material degradation due to the dose absorbed during the measurement. In this work, we propose a novel approach for reducing the dose and scanning times by undersampling the raster data. This is achieved by skipping rows within scans and reconstructing the x-ray spectromicroscopic measurements using low-rank matrix completion. The new method is robust and allows for x 5-6 reduction in sampling. Experimental results obtained on real data are illustrated.
