论文标题

快速噪声对被困的离子量子门的保真度的影响

The effect of fast noise on the fidelity of trapped-ions quantum gates

论文作者

Nakav, Haim, Finkelstein, Ran, Peleg, Lee, Akerman, Nitzan, Ozeri, Roee

论文摘要

高保真单一和多量程操作组成了量子信息处理的主干。这种保真度是基于以极端和精确的方式将单个或两量级别耦合的能力。相干量子演化的必要条件是驱动这些过渡的高度稳定的局部振荡器。在这里,我们研究了快速噪声的效果,即在频率上比本地振荡器线宽高得多的噪声对被困在离子系统中一分门和两分门的保真度。我们分析并测量快速噪声对单个量子操作的影响,包括共振$π$旋转和抗谐振的边带过渡。我们进一步分析了快速噪声对Molmer-Sorensen双Quit Gate的影响。我们找到了一种统一而简单的方法,可以通过量子响应频率下的噪声功率频谱密度给出的单个参数来估计所有这些操作的性能。尽管我们的分析侧重于相位噪声和捕获离子系统,但它与其他快速噪声的来源以及其他量子系统有关,在这些量子系统中,这种旋转量子量子与旋转量子量相关。我们的分析可以帮助指导量子硬件平台和大门的设计,从而提高了它们对容忍度量子计算的忠诚度。

High fidelity single and multi-qubit operations compose the backbone of quantum information processing. This fidelity is based on the ability to couple single- or two-qubit levels in an extremely coherent and precise manner. A necessary condition for coherent quantum evolution is a highly stable local oscillator driving these transitions. Here we study the effect of fast noise, that is noise at frequencies much higher than the local oscillator linewidth, on the fidelity of one- and two-qubit gates in a trapped-ion system. We analyze and measure the effect of fast noise on single qubit operations including resonant $π$ rotations and off-resonant sideband transitions . We further analyze the effect of fast phase noise on the Molmer-Sorensen two-qubit gate. We find a unified and simple way to estimate the performance of all of these operations through a single parameter given by the noise power spectral density at the qubit response frequency. While our analysis focuses on phase noise and on trapped-ion systems, it is relevant for other sources of fast noise as well as for other qubit systems in which spin-like qubits are coupled by a common bosonic field. Our analysis can help in guiding the deign of quantum hardware platforms and gates, improving their fidelity towards fault-tolerant quantum computing.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源