论文标题

EVHA:可解释的硬件测试和保证的视觉系统 - 概述

EVHA: Explainable Vision System for Hardware Testing and Assurance -- An Overview

论文作者

Hasan, Md Mahfuz Al, Mostafiz, Mohammad Tahsin, Le, Thomas An, Julia, Jake, Vashistha, Nidish, Taheri, Shayan, Asadizanjani, Navid

论文摘要

由于对不同部门的电子芯片的需求不断增长,因此,半导体公司被授权离岸其制造过程。这一不必要的事情使他们有关筹码的筹码的安全性和可信赖性,并引起了硬件攻击的创建。在这种情况下,半导体供应链中的不同实体可以恶意行事并对从设备到系统的设计计算层进行攻击。我们的攻击是一个硬件特洛伊木马,在不受信任的铸造厂中插入了在面具的生成/制造过程中。特洛伊木马通过加法,删除或设计单元的变化留下了脚印。为了解决这个问题,我们在这项工作中提出了可解释的视觉系统,以进行硬件测试和保证(EVHA),以检测以低成本,准确和快速的方式对设计的最小变化。该系统的输入是从正在检查的集成电路(IC)中获取的扫描电子显微镜(SEM)图像。系统输出是通过通过添加,删除或在单元格级的设计单元格中使用任何缺陷和/或硬件特洛伊木马来确定IC状态。本文概述了我们的国防系统的设计,开发,实施和分析。

Due to the ever-growing demands for electronic chips in different sectors the semiconductor companies have been mandated to offshore their manufacturing processes. This unwanted matter has made security and trustworthiness of their fabricated chips concerning and caused creation of hardware attacks. In this condition, different entities in the semiconductor supply chain can act maliciously and execute an attack on the design computing layers, from devices to systems. Our attack is a hardware Trojan that is inserted during mask generation/fabrication in an untrusted foundry. The Trojan leaves a footprint in the fabricated through addition, deletion, or change of design cells. In order to tackle this problem, we propose Explainable Vision System for Hardware Testing and Assurance (EVHA) in this work that can detect the smallest possible change to a design in a low-cost, accurate, and fast manner. The inputs to this system are Scanning Electron Microscopy (SEM) images acquired from the Integrated Circuits (ICs) under examination. The system output is determination of IC status in terms of having any defect and/or hardware Trojan through addition, deletion, or change in the design cells at the cell-level. This article provides an overview on the design, development, implementation, and analysis of our defense system.

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