论文标题
展示通用门集的可扩展随机基准测试
Demonstrating scalable randomized benchmarking of universal gate sets
论文作者
论文摘要
随机基准测试(RB)方案是评估量子门性能的最广泛使用的方法。但是,现有的RB方法要么不扩展到许多量子位,要么无法基准一个通用门集。在这里,我们使用称为随机镜电路的电路介绍并演示了许多通用和连续参数化门集的可扩展RB的技术。我们的技术可以应用于包含纠缠Clifford门的门集和一组任意的单量门门,以及包含围绕Pauli轴的受控旋转的门集。我们使用我们的技术来基准在高级量子测试床的四个量子位上基准的通用门集,其中包括包含受控的S门及其逆的门集,我们研究了观察到的错误率如何受到非clifford门的包含的影响。最后,我们证明了我们的技术缩放到许多量子位,并通过在27 Quition IBM Q处理器上进行实验。我们使用我们的技术来量化串扰对这款27 Quib的设备的影响,并发现它在随机多数Qubit Coussing层中贡献了每个门总误差的大约2/3。
Randomized benchmarking (RB) protocols are the most widely used methods for assessing the performance of quantum gates. However, the existing RB methods either do not scale to many qubits or cannot benchmark a universal gate set. Here, we introduce and demonstrate a technique for scalable RB of many universal and continuously parameterized gate sets, using a class of circuits called randomized mirror circuits. Our technique can be applied to a gate set containing an entangling Clifford gate and the set of arbitrary single-qubit gates, as well as gate sets containing controlled rotations about the Pauli axes. We use our technique to benchmark universal gate sets on four qubits of the Advanced Quantum Testbed, including a gate set containing a controlled-S gate and its inverse, and we investigate how the observed error rate is impacted by the inclusion of non-Clifford gates. Finally, we demonstrate that our technique scales to many qubits with experiments on a 27-qubit IBM Q processor. We use our technique to quantify the impact of crosstalk on this 27-qubit device, and we find that it contributes approximately 2/3 of the total error per gate in random many-qubit circuit layers.