论文标题
与应变的晶体成像中的对称性
Symmetries in TEM imaging of crystals with strain
论文作者
论文摘要
紧张的晶体的TEM图像通常表现出对称性，其来源并不总是清晰。为了理解这些对称性，我们区分从成像过程本身发生的对称性和可能影响图像的包含的对称性。对于成像过程，我们从数学上证明了强度在特定变换下是不变的。然后，这些不向导与应变特征的特定特性的结合可以解释在TEM图像中观察到的对称性。我们使用半导体纳米结构（例如量子井和量子点）中选定的示例在TEM图像中研究对称性的方法。
TEM images of strained crystals often exhibit symmetries, the source of which is not always clear. To understand these symmetries we distinguish between symmetries that occur from the imaging process itself and symmetries of the inclusion that might affect the image. For the imaging process we prove mathematically that the intensities are invariant under specific transformations. A combination of these invariances with specific properties of the strain profile can then explain symmetries observed in TEM images. We demonstrate our approach to the study of symmetries in TEM images using selected examples in the field of semiconductor nanostructures such as quantum wells and quantum dots.
