论文标题

4H-SIC中修饰的SI空缺的详尽表征

Exhaustive characterization of modified Si vacancies in 4H-SiC

论文作者

Davidsson, Joel, Babar, Rohit, Shafizadeh, Danial, Ivanov, Ivan G., Ivády, Viktor, Armiento, Rickard, Abrikosov, Igor A.

论文摘要

硅碳化物中带负电荷的硅空置($ \ mathrm {v_ {si}^ - } $)是量子应用程序的良好研究点缺陷。同时,对集合光致发光和电子顺磁共振测量的仔细检查显示了相关但迄今未识别的信号的丰富性。在这项研究中,我们在4H-SIC中搜索缺陷,这些缺陷解释了由自动缺陷分析和资格(ADAQ)工作流产生的缺陷数据库中上述磁光信号。该搜索只揭示了数据中表现出类似硅的性能的一类原子结构:碳反氨酸碳($ \ mathrm {c_ {si}} $)在距离硅空置的次级距离内仅略微改变后者而不会影响电荷或旋转状态的情况下,仅在硅空空间内略微改变。这种扰动在能量上是束缚的。我们考虑$ \ mathrm {v_ {si}^ - +c_ {si}} $最高2 nm距离并报告其零声子线和零字段分开值的形成。此外,我们在硅空缺区域进行高分辨率的光致发光实验,并找到大量的线条。比较我们的计算结果和实验结果,几种配置表现出很好的一致性。我们的工作证明了具有高通量的数据库在搜索量子应用中的缺陷方面的有效性。

The negatively charged silicon vacancy ($\mathrm{V_{Si}^-}$) in silicon carbide is a well-studied point defect for quantum applications. At the same time, a closer inspection of ensemble photoluminescence and electron paramagnetic resonance measurements reveals an abundance of related but so far unidentified signals. In this study, we search for defects in 4H-SiC that explain the above magneto-optical signals in a defect database generated by Automatic Defect Analysis and Qualification (ADAQ) workflows. This search reveals only one class of atomic structures that exhibit silicon-vacancy-like properties in the data: a carbon antisite ($\mathrm{C_{Si}}$) within sub-nanometer distances from the silicon vacancy only slightly alters the latter without affecting the charge or spin state. Such a perturbation is energetically bound. We consider the formation of $\mathrm{V_{Si}^-+C_{Si}}$ up to 2 nm distance and report their zero phonon lines and zero field splitting values. In addition, we perform high-resolution photoluminescence experiments in the silicon vacancy region and find an abundance of lines. Comparing our computational and experimental results, several configurations show great agreement. Our work demonstrates the effectiveness of a database with high-throughput results in the search for defects in quantum applications.

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