论文标题
纳米门学：分析电子显微镜成功的计划
Nanocartography: Planning for success in analytical electron microscopy
论文作者
论文摘要
随着材料系统的多样性的增加，分析技术的数量不断扩展，下一代工具的大量资本成本能够快速有效地收集电子显微镜中的数据，这对于成功的数据分析至关重要。因此，本研究提出了一种纳米刻造学方法的方法，该方法将预测阶段运动与晶体学信息相结合，以向显微镜提供一个样本图，既可以减少分析时间并提高对收集数据的信心。拥有与微观结构（例如，接口和增长的方向）和晶体学取向数据（例如，特定的杆和飞机）相关的舞台位置的路线图为显微镜家提供了求解方向关系的能力，可以求解方向关系，创建倾斜的倾斜系列电影，还可以在具有极小小尺度的尺度上溶解复杂的晶体学无知。最重要的是，它可以转换跨显微镜的任何样本取向关系，以增加整个领域的优化和协作。
With the increasing diversity in material systems, ever-expanding number of analysis techniques, and the large capital costs of next generation instruments the ability to quickly and efficiently collect data in the electron microscope has become paramount to successful data analysis. Therefore, this research proposes a methodology of nanocartography that combines predictive stage motion with crystallographic information to provide microscopists with a sample map that can both reduce analysis time and improve confidence in data collected. Having a road map of the stage positions linked to microstructural (e.g., interfaces and growing directions) and crystallographic orientation data (e.g., specific poles and planes) provides microscopists with the ability to solve orientation relationships, create oblique tilt series movies, and also solve complex crystallographic unknowns at extremely small scales with minimal information. Most importantly, it can convert any sample orientation relationships across microscopes to increase optimization and collaboration throughout the field.
