论文标题
基于光学显微镜的通用参数，用于识别二维材料中的层数
Optical microscope based universal parameter for identifying layer number in two-dimensional materials
论文作者
论文摘要
光学对比度是识别二维（2D）材料层层数的最常见初步方法，但很少用作确认技术。我们解释了成像系统之间光学对比度变化的原因。我们引入了一种通用方法，使用RGB（红色蓝色）和原始光学图像量化层编号。对于RGB图像，从具有变化的灯功率的光学图像中提取2D薄片（MOS2，WSE2，石墨烯）强度与底物强度的斜率。强度斜率标识层数，并且独立于系统。对于原始图像，强度斜率和强度比完全独立于系统和强度。因此，强度斜率（对于RGB）和强度比（对于RAW）是用于识别层编号的通用参数。基于FreSnel-反射的光学模型可与实验相匹配。此外，我们创建了一个基于MATLAB的图形用户界面，可以快速识别图层编号。预计该技术将加速异质结构的制备，并满足对通用光学对比方法的延长需求。
Optical contrast is the most common preliminary method to identify layer number of two-dimensional (2D) materials, but is seldom used as a confirmatory technique. We explain the reason for variation of optical contrast between imaging systems. We introduce a universal method to quantify the layer number using the RGB (red-green-blue) and RAW optical images. For RGB images, the slope of 2D flake (MoS2, WSe2, graphene) intensity vs. substrate intensity is extracted from optical images with varying lamp power. The intensity slope identifies layer number and is system independent. For RAW images, intensity slopes and intensity ratios are completely system and intensity independent. Intensity slope (for RGB) and intensity ratio (for RAW) are thus universal parameters for identifying layer number. A Fresnel-reflectance-based optical model provides an excellent match with experiments. Further, we have created a MATLAB-based graphical user interface that can identify layer number rapidly. This technique is expected to accelerate the preparation of heterostructures, and fulfil a prolonged need for universal optical contrast method.
