论文标题
用于透明导电膜的裂纹网络的几何模型
Geometric model of crack-templated networks for transparent conductive films
论文作者
论文摘要
裂纹模拟的网络，由牺牲薄膜中的裂纹图案制成的金属框架，可以表现出高光学透射率，高电导率以及许多对应用吸引的其他特性。尽管在破裂的模板网络的准备，表征和分析光电性能方面取得了进步，但有限的努力集中在预测其无序结构如何帮助确定其电气和光学特性并解释其相互关系的方面。我们引入了一种用于裂纹模拟网络的几何建模方法，并使用仿真来计算其波长和入射角依赖性的光传感器和板电阻率。我们探讨了这些属性如何相互关系以及具有定期订购的孔径数组的金属网格的关系。我们考虑结果对光电应用的含义，将图形的预测与实验数据进行比较，并突出显示使用逆方法扩展建模方法的机会。
Crack-templated networks, metallic frameworks fabricated from crack patterns in sacrificial thin films, can exhibit high optical transmittance, high electric conductivity, and a host of other properties attractive for applications. Despite advances in preparing, characterizing, and analyzing optoelectronic performance of cracked template networks, limited efforts have focused on predicting how their disordered structures help determine their electrical and optical properties and explain their interrelationships. We introduce a geometric modeling approach for crack-templated networks and use simulation to compute their wavelength- and incident angle-dependent optical transmittance and sheet resistivity. We explore how these properties relate to one another and to those of metallic meshes with periodically ordered aperture arrays. We consider implications of the results for optoelectronic applications, compare figure-of-merit predictions to experimental data, and highlight an opportunity to extend the modeling approach using inverse methods.
