论文标题
碳纳米管谐振器中快速双稳定性的直流签名
DC Signature of snap-through bi-stability in carbon nanotube resonators
论文作者
论文摘要
表现出Euler-Bernoulli的双稳定拱形梁在各种应用中被广泛用作电子设备,例如记忆设备,能量收割机,传感器和执行器。最近,我们报道了迄今为止最小的双稳定谐振器的实现,以弯曲的悬浮碳纳米管(CNT)的形式,该形式表现出独特的三维快速过渡和频率的极大变化。在本文中,我们介绍了这些设备的独特特征,其中在机械快速过渡中还观察到了DC电导的显着变化。在验证了由于“跳跃”而导致的CNT张力的变化无法解决测量的电导差之后,我们将电导“跳”归因于由于快速屈曲而导致电容的变化。但是,我们表明,对该现象的定量分析根本不是微不足道的,并且仅由于我们在过渡之前和之后预测确切的CNT形状的能力才能实现。了解这种机制可以快速对制造的设备进行快速表征,并提高我们对其行为的理解,这是进一步更好地开发该技术的关键。例如,我们展示了这种现象的滞后性状如何表明实现静态闩锁的能力,可用于RF开关,双稳定继电器和内存设备。
Bi-stable arched beams exhibiting Euler-Bernoulli snap-through buckling are vastly used as electronic devices in various applications, such as memory devices, energy harvesters, sensors, and actuators. Recently, we reported the realization of the smallest bi-stable resonator to date, in the form of a buckled suspended carbon nanotube (CNT), which exhibits a unique three-dimensional snap-through transition and an extremely large change in frequency as a result. In this article, we address a unique characteristic of these devices, in which a significant change in the DC conductance is also observed at the mechanical snap-through transition. After verifying that the change in the CNT tension due to the "jump" cannot account for the conductance difference measured, we attribute the conductance "jump" to the change in capacitance as a result of the snap-through buckling. However, we show that quantitative analysis of this phenomenon is not at all trivial, and is enabled only due to our ability to predict the exact CNT shape before and after the transition. Understanding this mechanism enables a fast characterization of fabricated devices and improves our understanding of their behavior, key in developing this technology further and better design. As an example, we show how the hysteretic trait of this phenomenon is indicative of the ability to achieve static latching, useful for RF switches, bi-stable relays, and memory devices.