论文标题

使用扫描隧道显微镜在表面掺杂SR掺杂的BI2SE3中超导性的可观察性

Observability of superconductivity in Sr-doped Bi2Se3 at the surface using scanning tunneling microscope

论文作者

Bagchi, Mahasweta, Brede, Jens, Ando, Yoichi

论文摘要

掺杂的BI2SE3的超导材料家族在凝结物理学领域仍在深入研究,这是由于大量拓扑非平凡的超导性的强有力的实验证据。但是,在这些材料的表面上,即使是超导本身的观察仍然存在争议。我们使用扫描隧道显微镜(STM)至0.4 k,以表明在散装超导SRXBI2SE3的表面上,只要使用清洁的金属探针尖端,就在费米能量周围观察到状态密度的间隙。然而,使用扫描电子显微镜和能量分散性X射线分析,我们发现SRXBI2SE3的微米大小的薄片很容易从样品转移到STM探针尖端上,并且此类薄片始终显示出状态密度的超导间隙。我们认为,当拓扑表面状态(TSS)完好无损时,SRXBI2SE3晶体中的超导性不会延伸到表面,但是在微薄层中,TSS由于应变而破坏,并允许超导性延伸至表面。为了理解这种现象,我们建议,由于固有的向上带弯曲而在TSS存在下始终在电子掺杂的BI2SE3中发现的局部电场,反对表面上的超导性。

The superconducting materials family of doped Bi2Se3 remains intensively studied in the field of condensed matter physics due to strong experimental evidence for topologically non-trivial superconductivity in the bulk. However, at the surface of these materials, even the observation of superconductivity itself is still controversial. We use scanning tunneling microscopy (STM) down to 0.4 K to show that on the surface of bulk superconducting SrxBi2Se3, no gap in the density of states is observed around the Fermi energy as long as clean metallic probe tips are used. Nevertheless, using scanning electron microscopy and energy-dispersive X-ray analysis, we find that micron-sized flakes of SrxBi2Se3 are easily transferred from the sample onto the STM probe tip and that such flakes consistently show a superconducting gap in the density of states. We argue that the superconductivity in SrxBi2Se3 crystals does not extend to the surface when the topological surface state (TSS) is intact, but in micro-flakes the TSS has been destroyed due to strain and allows the superconductivity to extend to the surface. To understand this phenomenon, we propose that the local electric field, always found in electron doped Bi2Se3 in the presence of the TSS due to an intrinsic upward band bending, works against superconductivity at the surface.

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