论文标题
QUDIT电路设计中的耐故障
Fault-tolerance in qudit circuit design
论文作者
论文摘要
多控制门的有效分解是电路深度和T门计数的量子编译中的重要因素。最近的工作表明，Qudits有可能减少从线性到对数深度的资源需求并避免分数相旋转。在这里，我们基于高数态在高点状态的缩放量的缩放，这不是主要因素，并且纠缠栅极和相互作用网络拓扑的选择都可以确定误差的传播和电路中的最终故障率。我们进一步表明，对于某些线性深度电路，通过选择性应用资源可以进行其他误差。
The efficient decomposition of multi-controlled gates is a significant factor in quantum compiling, both in circuit depth and T-gate count. Recent work has demonstrated that qudits have the potential to reduce resource requirements from linear to logarithmic depth and to avoid fractional phase rotations. Here we argue, based on the scaling of decoherence in high-index states, that circuit depth is not the primary factor, and that both the choice of entangling gate and interaction network topology act together to determine the spread of errors and ultimate failure rate in a circuit. We further show that for certain linear-depth circuits, additional error mitigation is possible via selective application of resources.
