论文标题
用于转移函数的Ti/pt/co多层堆栈基于转移函数的磁力显微镜校准
A Ti/Pt/Co multilayer stack for transfer function based magnetic force microscopy calibrations
论文作者
论文摘要
磁力显微镜是一种用于成像大约10纳米的磁性结构的广泛技术。可以通过确定仪器的校准点扩散函数，其仪器校准函数（ICF），从众所周知的参考样品的测量中确定校准点的扩散函数，其仪器校准函数（ICF）可以校准MFM以在A/M单位中获得定量的空间分辨磁化数据。除了量化MFM数据外，使用ICF对MFM图像数据的反卷积还可以纠正由MFM尖端杂散场分布的有限宽度引起的涂抹。但是，校准的质量严格取决于参考样品的磁化分布的计算性。在这里，我们讨论了Ti/pt/co多层堆栈，该堆栈将条纹结构域模式显示为合适的参考材料。对制造过程的精确控制，结合了样品微磁参数的表征，可以可靠地计算样品的磁性弹性场，这通过微磁模拟和QMFM测量之间的非常良好的一致性证明。显示和验证了使用Ti/PT/CO堆栈作为参考样品进行校准的QMFM测量，并讨论了用Ti/PT/CO堆栈校准的定量MFM测量的应用区域
Magnetic force microscopy is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample's magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed
