论文标题
粒状尼伯菌中的热点和Q斜率的模型
A model for hot spots and Q-slope in granular Niobium thin film superconducting RF cavities
论文作者
论文摘要
我们提出了一个模型来解释耗能，从而导致在尼伯菌薄膜超导射频腔内的内壁中形成热点。我们探索的物理机制是由于晶粒界面边界上表面电流流的收缩所致。这种收缩会产生额外的电接触电阻，从而诱导局部守时散热。这些斑点处的温度被得出；并且电阻表明，电阻取决于磁场，发生耗散的增益接触大小以及其他关键参数，包括有效的伦敦穿透深度和频率。表面电阻和质量因素是使用我们的模型确定的，并且与实验数据非常吻合。
We propose a model to explain power dissipation leading to the formation of hot spots in the inner walls of niobium thin film superconducting RF cavities. The physical mechanism that we explore is due to the constriction of surface electrical current flow at grain interface boundaries. This constriction creates an additional electrical contact resistance which induces localized punctual heat dissipation. The temperature at these spots is derived; and the electrical contact resistance is shown to depend on the magnetic field, on the gain contact size over which dissipation occurs, and on other key parameters, including the effective London penetration depth and the frequency. The surface resistance and the quality factors are determined using our model and are shown to be in excellent agreement with experimental data.
