论文标题

BI2SE3-XTEX的拉曼光谱(x = 0至3)拓扑绝缘子晶体

Raman Spectroscopy of Bi2Se3-xTex (x= 0 to 3) Topological Insulator Crystals

论文作者

Sharma, Deepak, Sharma, M. M., Meena, R. S., Awana, V. P. S.

论文摘要

我们报告了纯和混合式拓扑绝缘子的晶体生长和拉曼光谱表征。该系列包括二元和三丙岩拓扑绝缘子。我们详细分析了振动模式的拉曼峰值,例如平面Ag,例如在平面中,例如二进制和三元四亚岩拓扑拓扑剂。平面Ag均表现出明显的原子大小依赖性峰值变化,而对前者的效果比后者要小得多。在平面中,这种情况很有趣,例如,它不仅显示了变化,而且还显示了更广泛的驼峰结构。同一卷积显示了两个透明峰,这是从混合四亚岩拓扑绝缘子中的平面折叠和咬合模式中的单独存在来理解的。综上所述,在本文​​中报道并讨论了各种拉曼的纯净和混合拓扑绝缘子单晶的模式。

We report crystal growth and Raman spectroscopy characterization of pure and mixed bulk topological insulators. The series comprises of both binary and ternary tetradymite topological insulators. We analyzed in detail the Raman peaks of vibrational modes as out of plane Ag, and in plane Eg for both binary and ternary tetradymite topological insulators. Both out of plane Ag exhibit obvious atomic size dependent peak shifts and the effect is much lesser for the former than the latter. The situation is rather interesting for in plane Eg, which not only shows the shift but rather a broader hump like structure. The de convolution of the same show two clear peaks, which are understood in terms of the presence of separate in plane BiSe and BiTe modes in mixed tetradymite topological insulators. Summarily, various Raman modes of well-characterized pure and mixed topological insulator single crystals are reported and discussed in this article.

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