论文标题
基于马赫的干涉仪的调谐叉微波阻抗显微镜
A Mach-Zehnder interferometer based tuning fork microwave impedance microscope
论文作者
论文摘要
我们在这里描述了基于家庭制造的基于调谐叉子的扫描探针显微镜（SPM）上基于干涉仪的微波阻抗显微镜的实现。基于调谐的SPM，仅需要两个电气接触才能进行自我施用和调谐叉振荡的自我检测，特别适合在极端环境中的操作，例如低温，高磁场或受限的几何形状，在这种情况下，很难引入常规的悬臂挠度检测所需的光学成分。大多数现有的和市售的系统都依赖于对特殊设计的微波悬臂的偏转的光学检测，从而限制了其应用。最近实现了一个基于调节叉的微波阻抗显微镜，该显微镜在尖端附近具有谐振腔：我们在这里报告了一种增强功能，其中包含微波干涉仪，可为噪声提供更好的信号，并在微波频率方面提供更大的可调性。
We describe here the implementation of an interferometer-based microwave impedance microscope on a home-built tuning-fork based scanning probe microscope (SPM). Tuning-fork based SPMs, requiring only two electrical contacts for self-actuation and self-detection of the tuning fork oscillation, are especially well suited to operation in extreme environments such as low temperatures, high magnetic fields or restricted geometries where the optical components required for conventional detection of cantilever deflection would be difficult to introduce. Most existing and commercially available systems rely on optical detection of the deflection of specially designed microwave cantilevers, limiting their application. A tuning-fork based microwave impedance microscope with a resonant cavity near the tip was recently implemented: we report here an enhancement that incorporates a microwave interferometer, which affords better signal to noise as well as wider tunability in terms of microwave frequency.
