论文标题
通过成像双层石墨烯moiré模式评估的近场浸入微波显微镜的极限
The limits of Near Field Immersion Microwave Microscopy evaluated by imaging bilayer graphene Moiré patterns
论文作者
论文摘要
分子和原子成像需要电子和扫描探针显微镜的发展，以超过衍射规定的物理极限。纳米粉红外实验和Pico-cavity尖端增强的拉曼光谱成像后来证明，可见范围内的辐射可以通过使用扫描探针尖端来访问近场状态，从而超过此极限。在这里，我们表明，可以使用扫描微波成像显微镜来揭示特征大小降低至1〜nm的结构，并使用波长的0.1〜m降低到1〜nm。作为一种测试材料，我们使用扭曲的双层石墨烯，这不仅是一个非常重要的新主题，因此由于发现了相关的电子效应，例如超导性，而且还因为它提供了一个样品，我们可以系统地调整从下方的纳米量数到几个纳米纳米的上层结构Moiré模式调制。通过分析尖端样本距离动力学，我们证明了通过使用液体浸入显微镜概念和施加在纳米级水弯曲器上的精致力控制，可以实现这种最终的10 $^8 $探针到模式分辨率。
Molecular and atomic imaging required the development of electron and scanning probe microscopies to surpass the physical limits dictated by diffraction. Nano-infrared experiments and pico-cavity tip-enhanced Raman spectroscopy imaging later demonstrated that radiation in the visible range can surpass this limit by using scanning probe tips to access the near-field regime. Here we show that ultimate resolution can be obtained by using scanning microwave imaging microscopy to reveal structures with feature sizes down to 1~nm using a radiation of 0.1~m in wavelength. As a test material we use twisted bilayer graphene, which is not only a very important recent topic due to the discovery of correlated electron effects such as superconductivity, but also because it provides a sample where we can systematically tune a superstructure Moiré patterns modulation from below one up to tens of nanometers. By analyzing the tip-sample distance dynamics, we demonstrate that this ultimate 10$^8$ probe-to-pattern resolution can be achieved by using liquid immersion microscopy concepts and exquisite force control exerted on nanoscale water menisci.
