论文标题
使用$^{22} $ na和$^{83 {\ rm m}} $ kr来校准和研究Xenon掺杂液体氩气的闪烁属性
Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon
论文作者
论文摘要
我们已经使用$^{22} $ na源测量了液体氩气浓度从165 ppm到10,010 ppm的液体氩气中闪烁光的性质。详细讨论了氙气液体氩气中的能量传递过程，并建立了新的波形模型并用于适合平均波形。介绍了闪烁的光子在掺杂的液体氩气和TPB发射的时间曲线。 XENON掺杂的数量由质量流控制器控制，该质量流通过质量流量控制器，该质量流通过重新燃气分析仪进行校准，以确保XENON浓度准确。此外，首次在Xenon-Doped Liquid Argon检测器中实现了$^{83 {\ rm m}} $ kr的成功测试。通过比较$^{22} $ na和$^{83 {\ rm m}} $ kr的光收益，可以得出结论，闪烁效率在41.5 keV至511 keV的范围内几乎相同。
We have measured the properties of scintillation light in liquid argon doped with xenon concentrations from 165 ppm to 10,010 ppm using a $^{22}$Na source. The energy transfer processes in the xenon-doped liquid argon are discussed in detail, and a new waveform model is established and used to fit the average waveform. The time profile of the scintillation photon in the xenon-doped liquid argon and of the TPB emission are presented. The quantities of xenon-doped are controlled by a Mass Flow Controller which is calibrated via a Redusial Gas Analyzer to ensure that the xenon concentration is accurate. In addition, a successful test of $^{83{\rm m}}$Kr as a calibration source has been implemented in the xenon-doped liquid argon detector for the first time. By comparing the light yield of the $^{22}$Na and $^{83{\rm m}}$Kr, it can be concluded that the scintillation efficiency is almost same over the range of 41.5 keV to 511 keV.
