论文标题
直接分析超低背景材料上表面污染的定量分析，从暴露于灰尘
Direct method for the quantitative analysis of surface contamination on ultra-low background materials from exposure to dust
论文作者
论文摘要
在这项工作中，我们提出了一种直接确定材料表面上污染物的污染物从暴露到灰尘的方法。研究了天然存在的放射性核素K-40，TH-232，U-238和稳定的PB。到目前为止，从辐射模型和假定的灰尘组成中估计了灰尘颗粒物的背景贡献。我们的方法利用各种低背景收集介质在感兴趣的位置进行暴露，然后使用电感耦合等离子体质谱法（ICP-MS）进行表面浸出和渗滤液分析。该方法在西北国家实验室（PNNL）和Snolab地下设施的选定位置进行了验证和应用。
In this work we present a method for the direct determination of contaminant fallout rates on material surfaces from exposure to dust. Naturally occurring radionuclides K-40, Th-232, U-238 and stable Pb were investigated. Until now, background contributions from dust particulate have largely been estimated from fallout models and assumed dust composition. Our method utilizes a variety of low background collection media for exposure in locations of interest, followed by surface leaching and leachate analysis using inductively coupled plasma mass spectrometry (ICP-MS). The method was validated and applied in selected locations at Pacific Northwest National Laboratory (PNNL) and the SNOLAB underground facility.
