论文标题
计算弯曲晶晶片的弹性变形和X射线衍射特性的一般方法
General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers
论文作者
论文摘要
弯曲的单晶在硬X射线方案中广泛使用。由于其较大的实体角度覆盖范围和聚焦特性，在光子输出较低的应用中，环形弯曲的晶体非常有用。球形弯曲的晶体，一个环形弯曲的晶体的亚组，尤其是在同步子的许多乐器和游离电子激光照明端端站中找到了自己的道路，但在高分辨率实验室尺度X射线光谱的重新出现。当旨在实现最佳光谱仪性能时，必须对此类晶体的衍射特性有实心理论理解。在这项工作中，我们提出了一种一般方法，用于计算环形弯曲晶体的内部应力和应变场以及如何应用它以预测其衍射特性。由于它们在当代仪器中的流行，因此对圆形和矩形球形弯曲的晶圆进行了溶液和讨论。
Curved single crystals are widely employed in spectrometer designs in the hard X-ray regime. Due to their large solid angle coverage and focusing properties, toroidally bent crystals are extremely useful in applications where the output of photons is low. Spherically bent crystals, a subgroup of toroidally bent crystals, particularly have found their way in many instruments at synchtrotrons and free electron laser lightsource end-stations but also in the re-emerging field of high-resolution laboratory-scale X-ray spectroscopy. A solid theoretical understanding of the diffraction properties of such crystals is essential when aiming for optimal spectrometer performance. In this work, we present a general method to calculate the internal stress and strain fields of toroidally bent crystals and how to apply it to predict their diffraction properties. Solutions are derived and discussed for circular and rectangular spherically bent wafers due to their prevalence in contemporary instrumentation.
