论文标题
$^{\ mathbf {210}} $ bi $β$ -spectrum的精确度量
Precision measurement of $^{\mathbf{210}}$Bi $β$-spectrum
论文作者
论文摘要
$^{210} $ bi（历史上rae）的$β-$频谱形状的精确度量是用基于半导体Si（li）检测器的光谱仪进行的。这个第一个禁止的非唯一过渡具有在$^{210} $ pb背景的情况下，在低背景物理学中的统一和知识将在低背景物理学中起重要作用。测得的过渡形式可以近似为$ s（w）= 1 +（-0.4363 \ pm 0.0037）w +（0.0523 \ pm 0.0010）w^2 $，与以前的研究非常吻合，并且已经显着提高了参数精度。
The precision measurement of the $β-$spectrum shape for $^{210}$Bi (historically RaE) have been performed with a spectrometer based on semiconductor Si(Li) detector. This first forbidden non-unique transition has the transition form-factor strongly deviated from unity and knowledge of its spectrum would play an important role in low-background physics in presence of $^{210}$Pb background. The measured transition form-factor could be approximated as $S(W) = 1 + (-0.4363 \pm 0.0037) W + (0.0523 \pm 0.0010) W^2$, that is in good agreement with previous studies and has significantly increased parameter precision.
