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Analog to digital conversion is a very important part of almost all beam instrumentation systems. Ideally, in a properly designed system, the used analog to digital converter (ADC) should not limit the system performance. However, despite recent improvements in ADC technology, quite often this is not possible and the choice of the ADC influences significantly or even restricts the system performance. It is therefore very important to estimate the requirements for the analog to digital conversion at an early stage of the system design and evaluate whether one can find an adequate ADC fulfilling the system specification. In case of beam instrumentation systems requiring both, high time and amplitude resolution, it often happens that the system specification cannot be met with the available ADCs without applying special processing to the analog signals prior to their digitisation. In such cases the requirements for the ADC even influence the system architecture. This paper aims at helping the designer of a beam instrumentation system in the process of selecting an ADC, which in many cases is iterative, requiring a trade off between system performance, complexity and cost. Analog to digital conversion is widely and well described in the literature, therefore this paper focusses mostly on aspects related to beam instrumentation. The ADC fundamentals are limited to the content presented as an introduction during the CAS one-hour lecture corresponding to this paper.