论文标题

BI $ _2 $ TE $ _3 $的Landau级别光谱

Landau level spectroscopy of Bi$_2$Te$_3$

论文作者

Mohelsky, I., Dubroka, A., Wyzula, J., Slobodeniuk, A., Martinez, G., Krupko, Y., Piot, B. A., Caha, O., Humlicek, J., Bauer, G., Springholz, G., Orlita, M.

论文摘要

在这里,我们报告了磁场中的Landau水平光谱法在拓扑绝缘子Bi $ _2 $ _2 $ _3 $外寿险上生长的BAF $ _2 $ sibstrate上的薄膜上进行了34吨。观察到的响应与直接间隙半导体的图片一致,在该图像中,电荷载体与巨大的狄拉克颗粒非常相似。基本带隙达到$ e_g =(175 \ pm 5)$ 〜MEV在低温下,它不在三角形轴上,因此显示了六个或十二个山谷的变性。值得注意的是,我们的磁光数据并未指示任何频段倒置。这表明,基本的频段差距与$γ$点相对较远,在$γ$点上存在深刻的反演,并升至相对论的表面状态,$ _2 $ _2 $ te $ _3 $。

Here we report on Landau level spectroscopy in magnetic fields up to 34 T performed on a thin film of topological insulator Bi$_2$Te$_3$ epitaxially grown on a BaF$_2$ substrate. The observed response is consistent with the picture of a direct-gap semiconductor in which charge carriers closely resemble massive Dirac particles. The fundamental band gap reaches $E_g=(175\pm 5)$~meV at low temperatures and it is not located on the trigonal axis, thus displaying either six or twelvefold valley degeneracy. Notably, our magneto-optical data do not indicate any band inversion. This suggests that the fundamental band gap is relatively distant from the $Γ$ point where profound inversion exists andgives rise to relativistic-like surface states of Bi$_2$Te$_3$.

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