论文标题
通过自旋霍尔效应隧道光谱测定拓扑表面状态的平面外自旋极化
Determination of Out-of-plane Spin Polarization of Topological Surface States by Spin Hall Effect Tunneling Spectroscopy
论文作者
论文摘要
当一个人想在自旋设备中应用拓扑绝缘子时，确定拓扑表面状态的详细自旋纹理很重要。原则上，可以通过类似于所谓的Meservey-Tedrow技术的方法来测量表面状态的平面自旋成分。在目前的工作中，我们建议可以通过旋转霍尔效应隧道光谱法确定平面外旋转成分。我们得出一个分析公式，该公式允许从自旋霍尔效应隧道光谱中提取平面外旋转组件。我们使用BI $ _2 $ SE $ _3 $和SB $ _2 $ TE $ _3 $的BI $ _2 $ SE $ _3 $的现实紧密结合模型测试我们的公式。我们证明，提取的平面外自旋极化与实际面外自旋极化非常吻合。
Determining the detailed spin texture of topological surface states is important when one wants to apply topological insulators in spintronic devices. In principle, the in-plane spin component of the surface states can be measured by a method analogous to the so-called Meservey-Tedrow technique. In the present work we suggest that the out-of-plane spin component can be determined by spin Hall effect tunneling spectroscopy. We derive an analytical formula that allows to extract the out-of-plane spin component from spin Hall effect tunneling spectra. We test our formula using realistic tight-binding models of Bi$_2$Se$_3$ and Sb$_2$Te$_3$. We demonstrate that the extracted out-of-plane spin polarization is in very good agreement with the actual out-of-plane spin polarization.
