论文标题
石墨烯的透射氦离子显微镜
Transmission Helium Ion Microscopy of Graphene
论文作者
论文摘要
我们将透射率显微镜（HIM）与石墨烯支持膜的透射电子显微镜（TEM）进行比较。我们提出了与材料（SRIM）预测中的散射和离子范围进行比较的斑点传输模式，并根据集成的摄像机强度显示了扫描He $^+$传输图像的示例。我们还考虑了连贯他分散的潜力。
We compare transmission He ion microscopy (HIM) to transmission electron microscopy (TEM) of graphene support films. We present spot transmission patterns that compare with scattering and range of ions in materials (SRIM) predictions, and show examples of scanning He$^+$ transmission images, based on integrated camera intensity. We also consider the potential for coherent HIM scattering.
