论文标题
单晶BI2SE3拓扑绝缘子中时间分辨的超快光谱探索Terahertz
Exploration of terahertz from time-resolved ultrafast spectroscopy in single-crystal Bi2Se3 topological insulator
论文作者
论文摘要
在本文中,我们使用超快的瞬态吸收光谱谱图在飞机战时域中重新调用BI2SE3单晶薄片的差分反射信号,从而根据样品中产生的Terahertz频率探索了实验数据。本研究中使用了具有菱形的菱形结构和分层形态的良好表征的自流量生长的Bi2SE3单晶的剥落片。使用时间分辨的超快技术,研究了通过650 nm的泵激光器以650 nm的反射信号生成相同的动力学轮廓。估计剪影作为探针延迟的函数,以预测Terahertz生成的能力。在这里,执行两种方法FFT(快速傅立叶变换)和FFD(过滤高频组件,然后进行拟合数据),以估计系统中生成的Terahertz的值。在比较两个(FFT&FFD)的同时,发现在Terahertz频率的预测中发生了很大的差异。总而言之,我们不仅报告了BI2SE3薄片中Terahertz的产生,而且还指出,确切的数量级和同一能力取决于分析方法。重要的是要从背景一个中提取振动信号,以便通过任何量子材料找到Terahertz生成的确切数量级和能力。
In this article, we reconnoiter the differential reflection signal of a Bi2Se3 single crystal flake, using ultrafast transient absorption spectroscopy in the femtosecond time domain and thereby explore the experimental data in terms of terahertz frequency generated in the sample. An exfoliated flake of a well characterized self-flux grown bulk Bi2Se3 single crystal having rhombohedral structure and layered morphology is used in the present study. The kinetic profile of the same being generated through a reflection signal by a pump laser of 650 nm at an average power of 0.5 mW is studied utilizing time-resolved ultrafast technique. The silhouette as a function of probe delay predicting the capability of the terahertz generation is estimated. Here, two methods FFT (fast Fourier transformation) and FFD (filtering high-frequency component followed by fitting data) are performed to estimate the value of terahertz generated in the system. While comparing the two (FFT & FFD) it is found that a large amount of magnitude difference occurs in the prediction of terahertz frequency. Summarily, we not only report the generation of terahertz in Bi2Se3 flake, also but points out that the exact order of magnitude and the capability of the same depends upon the method of analysis. It is important to extract the vibration signal from the background one so that to find the exact order of magnitude and capability of terahertz generation by any quantum material.