论文标题

几层inse的光致动力学

Photoluminescence dynamics in few-layer InSe

论文作者

Venanzi, Tommaso, Arora, Himani, Winnerl, Stephan, Pashkin, Alexej, Chava, Phanish, Patanè, Amalia, Kovalyuk, Zakhar D., Kudrynskyi, Zalhar R., Watanabe, Kenji, Taniguchi, Takashi, Erbe, Artur, Helm, Manfred, Schneider, Harald

论文摘要

我们研究了HBN中包裹的Inse薄片的光学性质。更具体地说,我们研究了光致发光(PL)发射及其对样品厚度和温度的依赖性。通过对PL线形的分析,我们讨论了激子和电子孔贡献的相对权重。此后,我们研究了PL动力学。在低温下可区分两种贡献:直接带隙电子孔和缺陷辅助重组。这两个重组过程的寿命分别为$τ_1\ sim 8 \; $ ns和$τ_2\ sim 100 \; $ ns。直接带隙和缺陷辅助贡献的相对权重表明,由于直接到间接的带隙跨度,层依赖性很强。电子孔PL寿命受到种群转移至低能状态的限制,并且没有观察到对层数的依赖。对于较薄的样品,缺陷辅助重组的寿命更长。最后,我们表明,由于更有效的非辐射重组,PL寿命在高温下降低。

We study the optical properties of thin flakes of InSe encapsulated in hBN. More specifically, we investigate the photoluminescence (PL) emission and its dependence on sample thickness and temperature. Through the analysis of the PL lineshape, we discuss the relative weights of the exciton and electron-hole contributions. Thereafter we investigate the PL dynamics. Two contributions are distinguishable at low temperature: direct bandgap electron-hole and defect-assisted recombination. The two recombination processes have lifetime of $τ_1 \sim 8\;$ns and $τ_2 \sim 100\;$ns, respectively. The relative weights of the direct bandgap and defect-assisted contributions show a strong layer dependence due to the direct-to-indirect bandgap crossover. Electron-hole PL lifetime is limited by population transfer to lower-energy states and no dependence on the number of layers was observed. The lifetime of the defect-assisted recombination gets longer for thinner samples. Finally, we show that the PL lifetime decreases at high temperatures as a consequence of more efficient non-radiative recombinations.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源