论文标题

增长条件对srfe $ _ {12} $ o $ _ {19} $薄膜的磁性和co / srfe $ _ {12} $ o $ $ _ {19} $ biLayers的行为的影响

Influence of the growth conditions on the magnetism of SrFe$_{12}$O$_{19}$ thin films and the behavior of Co / SrFe$_{12}$O$_{19}$ bilayers

论文作者

Soria, G. D., Marco, J. F., Mandziak, A., Sánchez-Cortés, S., Sánchez-Arenillas, M., Prieto, J. E., Dávalos, J., Foerster, M., Aballe, L., López-Sánchez, J., Guzmán-Mínguez, J. C., Granados-Miralles, C., de la Figuera, J., Quesada, A.

论文摘要

Srfe $ _ {12} $ o $ _ {19} $(SFO)膜在SI(100)底物上通过射频磁铁溅射在SI(100)基板上生长的胶片,以显微镜,衍射和光谱技术的组合来表征由组成,结构和磁性。 Mössbauer光谱法用于确定磁化磁化的方向,发现膜的磁力化是由溅射功率和膜的厚度所控制的。此外,通过基于同步加速器的光谱镜技术研究了SFO膜与沉积钴叠层器之间的耦合。建议在SFO/CO接口处进行结构耦合,以说明实验性观察。进行微磁模拟,以重现系统的实验行为。

SrFe$_{12}$O$_{19}$ (SFO) films grown on Si (100) substrates by radio-frequency magnetron sputtering have been characterized in terms of composition, structural and magnetic properties by a combination of microscopy, diffraction and spectroscopy techniques. Mössbauer spectroscopy was used to determine the orientation of the films magnetization, which was found to be controlled by both the sputtering power and the thickness of the films. Additionally, the coupling between the SFO films and a deposited cobalt overlayer was studied by means of synchrotron-based spectromicroscopy techniques. A structural coupling at the SFO/Co interface is suggested to account for the expetimental observations. Micromagnetic simulations were performed in order to reproduce the experimental behaviour of the system.

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