论文标题
由于时钟分配网络中的单个事件瞬变而引起的功能故障率
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks
论文作者
论文摘要
随着技术缩放，较低的电源电压和较高的工作频率时钟分配网络越来越容易受到瞬态故障的影响。这些断层会导致范围内的效果，因此显着导致电路的功能故障率。本文提出了一种分析功能行为如何受到时钟分布网络中单事件瞬变的影响的方法。该方法基于逻辑级模拟，因此仅使用设计的寄存器转移级别描述。因此，提出了一个故障模型，该模型由于时钟网络中辐射诱导的瞬变而引起的主要影响。该故障模型可以计算每个单独的时钟缓冲区单个瞬变以及完整网络引起的功能故障率。此外，它允许识别与时钟网络中与单事件瞬变相关的最脆弱的触发器。 所提出的方法是在一个实际示例中应用的，并进行了故障注射运动。为了评估单个事件瞬变在时钟分布网络中的影响，将获得的功能故障率与顺序逻辑中单事件UPSET引起的错误率进行了比较。
With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can cause circuit-wide effects and thus, significantly contribute to the functional failure rate of the circuit. This paper proposes a methodology to analyse how the functional behaviour is affected by Single-Event Transients in the clock distribution network. The approach is based on logic-level simulation and thus, only uses the register-transfer level description of a design. Therefore, a fault model is proposed which implements the main effects due to radiation-induced transients in the clock network. This fault model enables the computation of the functional failure rate caused by Single-Event Transients for each individual clock buffer, as well as the complete network. Further, it allows the identification of the most vulnerable flip-flops related to Single-Event Transients in the clock network. The proposed methodology is applied in a practical example and a fault injection campaign is performed. In order to evaluate the impact of Single-Event Transients in clock distribution networks, the obtained functional failure rate is compared to the error rate caused by Single-Event Upsets in the sequential logic.
