TECHNICAL ISO/TS SPECIFICATION 23302 First edition 2021-11 Nanotechnologies Requirements and recommendations for the identification of measurands that characterise nano-objects and materials that contain them Nanotechnologies - Exigences et recommandations pour I'identification des mesurandes qui caracterisent les nano-objets et les matériaux les contenant Reference number IEC IS0/TS 23302:2021(E) ISO @IS02021 IS0/TS 23302:2021(E) COPYRIGHT PROTECTED DOCUMENT @ IS0 2021 All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may the internet or an intranet, withoutpriorwrittenpermission.Permission can be requested from eitherIso at the addressbelow or Iso's member body in the country of the requester. ISO copyright office CP 401 · Ch. de Blandonnet 8 CH-1214Vernier,Geneva Phone: +41 22 749 01 11 Email: [email protected] Website: www.iso.org PublishedinSwitzerland i @ IS0 2021 - All rights reserved IS0/TS 23302:2021(E) Contents Page Foreword. ..vii Introduction. ..viii 1 Scope.. 1 2 Normative references .1 3 Terms and definitions. 1 3.1 General core terms. 1 3.2 Measurand related terms. .3 4 Abbreviated terms 6 5 Approaches to identify measurands to characterize nano-objects and their agglomerates and aggregates, and materials containing nano-objects 9 5.1 Procedure. .9 5.2 Types of measurands .10 5.3 Stateofnano-objects .10 6 Measurands related to size and shape measurement of nano-objects and their agglomerates and aggregates 11 6.1 General. 11 6.2 Measurands related to size and shape measurement 11 6.2.1 Overview. 11 6.2.2 Generalrelevant standards 12 6.3 Measurands related to size and shape measurement in aerosols 12 6.3.1 Overview. 12 6.3.2 General relevant standards. 13 6.3.3 Electrical low-pressure impaction 13 6.3.4 Cascade impactors. 14 6.3.5 Differential mobility analysing system 14 6.3.6 Relevantstandards 15 6.3.7 Optical particle counter .15 6.3.8 Relevant standards. 15 6.3.9 Aerodynamic particle sizing. 15 6.3.10 TEM combined with TEM grid samplers 15 6.3.11 Relevant standards 16 6.3.12 Scanning electron microscopy 16 6.3.13 Relevant standards. 17 6.4 Measurands related to size and shape measurement in powders. 17 6.4.1 Overview 17 6.4.2 Relevant standards 17 6.4.3 Scanning electron microscopy 18 6.4.4 Relevant standards .18 6.4.5 Gas adsorption, the BET method .18 6.4.6 Relevant standard. 18 6.4.7 Laserdiffraction .18 6.4.8 Relevant standard. 19 6.4.9 X-ray diffraction. 19 6.4.10 Relevant standards 19 6.4.11 Raman spectroscopy 19 6.5 Measurands related to size and shape measurements of nano-objects in liquid dispersions. 20 6.5.1 Overview 20 6.5.2 Centrifugal liquid sedimentation 21 6.5.3 Relevant standards. 21 6.5.4 Dynamic light scattering 21 6.5.5 Relevant standards... 22 @ IS0 2021 - All rights reserved ii IS0/TS 23302:2021(E) 6.5.6 Laser diffraction 22 6.5.7 Relevant standard 22 6.5.8 Small angle X-ray scattering .22 Relevant standard. ..2 6.5.9 6.5.10 Particle tracking analysis .22 6.5.11 Relevant standards . 23 6.5.12 Electron microscopy. .23 6.5.13 Field flow fractionation .23 6.5.14 Relevant standard. ..24 6.5.15 Single particle ICP-MS .24 6.5.16Relevantstandard .25 6.6 Measurands related to size and shape measurement on surfaces (microscopy technigues) .25 6.6.1 Overview .25 6.6.2 Scanning electron microscopy. .25 6.6.3 Atomic force microscopy .25 6.6.4 Relevantstandards .26 7 Measurands related to chemical analysis of nano-objects and their agglomerates and aggregates. .26 7.1 General .26 7.2 Measurands related to surface chemical analysis of nano-objects and their agglomerates and aggregates. .27 7.2.1 Measurands. 27 7.2.2 Auger electron spectroscopy. .28 7.2.3 Relevant standards .28 7.2.4 Electron energy loss spectroscopy .28 7.2.5 Relevant standard. .28 7.2.6 Secondary ion mass spectroscopy 28 7.2.7 Relevant standards 29 7.2.8 X-ray fluorescence spectroscopy .29 7.2.9 Relevant standards .30 7.2.10 X-ray diffraction. 30 7.2.11 R