ISO/IEC INTERNATIONAL STANDARD 18047-6 Second edition 2017-10 Information technology Radio frequency identification device conformance test methods Part 6: Test methods for air interface communications at 860 MHz to 960 MHz Technologies de I'information -Méthodes d'essai de conformité du dispositif d'identification de radiofrequence - Partie 6: Methodes d'essai pour des communications d'une interface d'air a 860 MHz et jusqu'a 960 MHz Reference number TEC IS0/IEC18047-6:2017(E) is Copyright International Organization for Standardization @IS0/IEC 2017 t license from IHS IS0/IEC 18047-6:2017(E) COPYRIGHTPROTECTEDDOCUMENT IS0/IEC 2017, Published in Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISO's member body in the country of the requester. ISOcopyrightoffice Ch. de Blandonnet 8 · CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 [email protected] www.iso.org @ IS0/IEC 2017 - All rights reserved ogical Univ/5926867100, User=JACKEY, MA Noreproduc networking permited withoutlicense from IHS IS0/IEC 18047-6:2017(E) Contents Page Foreword ..vi Introduction. ..vii 1 Scope. 2 Normative references 3 Terms, definitions, symbols and abbreviated terms. ..2 4 Default conditions applicable to the test methods. ..3 4.1 Test environment .3 4.2 Pre-conditioning .3 4.2.1 General .3 4.2.2 Default tolerance .3 4.2.3 Noise floor at test location. 3 4.2.4 Total measurement uncertainty 3 5 Setup of test equipment .4 5.1 Setup of test equipment for interrogator tests. 4 5.1.1 General. .4 5.1.2 Sense antenna. 4 5.1.3 Test apparatus and test circuits for IS0/IEC 18000-61, IS0/IEC 18000-62 and IS0/IEC 18000-63 interrogator. 4 5.2 Setup of test equipment for tag tests 5 5.2.1 General. ..5 5.2.2 Test apparatus and test circuits for IS0/IEC 18000-61, IS0/IEC 18000-62, IS0/IEC 18000-63 and IS0/IEC 18000-64 tags. 6 Conformance tests for IS0/IEC 18000-61 6.1 Functional tests of interrogator .6 6.1.1 Interrogator modulation test. 6.1.2 Interrogator demodulation and turn-around time 7 6.2 Functional tests of tag ..8 6.2.1 Tag demodulation and turn-around time. ..8 6.2.2 Tag backscatter. ..8 6.2.3 Tag response time .9 6.2.4 Tag bit rate. .10 6.2.5 Tag state storage time. .10 7 Conformance tests for IS0/IEC 18000-62 .11 7.1 Functional tests of interrogator .11 7.1.1 Interrogator modulation test ..11 7.1.2 Interrogator demodulation and turn-around time .12 7.2 Functional tests of tag. ..12 7.2.1 Tag demodulation and turn-around time .12 7.2.2 Tag backscatter. ..13 7.2.3 Tag response time. ..14 7.2.4 Tag bit rate. ..15 7.2.5 Tag state storage time. .15 8 Conformance tests for IS0/IEC 18000-63 ..16 8.1 Functional tests of interrogator ..16 8.1.1 Interrogator data encoding. .16 8.1.2 Interrogator RF envelope parameters ..17 8.1.3 Interrogator RF power-up and power-down parameters. 8.1.4 Interrogator preamble parameters. .19 8.1.5 Interrogator link timing T2 20 8.1.6 Interrogator link timing T3 21 8.1.7 Interrogator link timing T4. 22 yrtnematonalAll rights reerved ii ACKEY,MA No reproduction or networking permitted without license from IHS Not for Resale, IS0/IEC 18047-6:2017(E) 8.2 Functional tests of tag. 23 8.2.1 Tag frequency range 23 8.2.2 Tag demodulation capability 24 8.2.3 Tag duty cycle 25 8.2.4 Tag preamble. 26 8.2.5 Tag link frequency tolerance and variation 28 8.2.6 Tag link timing Ti 29 8.2.7 Tag link timing T2 30 8.2.8 Tag link timing T5 31 8.2.9 Tag link timing T6 32 8.2.10 Tag link timing T7 33 8.2.11 Tag state diagram 34 8.2.12 Tag backscatter (optional) 36 8.3 Additional protocol related tests. 37 8.3.1 Memory overruns. 37 8.3.2 Kill command. 38 8.3.3 Unauthorized Write command 38 8.3.4 Optional commands