ISO INTERNATIONAL STANDARD 12789-1 First edition 2008-03-01 Reference radiation fields Simulated workplace neutron fields Part 1: Characteristics and methods of production Champs de rayonnement de reference - Champs de neutrons simulantceuxdepostesdetravail- Partie 1: Caracteristiques et méthodes de production Reference number ISO 12789-1:2008(E) @ISO 2008 ISO 12789-1:2008(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobe's licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In accepts no liability in this area. Adobe is a trademark of Adobe Systems Incorporated. Details of the software products used to create this PDF fle can be found in the General Info relative to the file; the PDF-creation parameters were optimized for printing. Every care has been taken to ensure that the file is suitable for use by IsO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. COPYRIGHTPROTECTEDDOCUMENT ?ISO2008 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, IsO's member body in the country of the requester. ISO copyright office Case postale 56. CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail [email protected] Web www.iso.org Published in Switzerland ii @ ISO 2008 - All rights reserved ISO 12789-1:2008(E) Contents Page Foreword. Introduction 1 Scope 2 Normative references 3 Terms and definitions 4 Simulated workplace neutron fields ... 5 General requirements for the production of simulated workplace neutron spectra 6 Characterization of simulated workplace neutron fields... 7 Fluence to dose-equivalent conversion coefficients.. 6 8 Sources of uncertainty.... 9 Expression and reporting of uncertainties . Annex A (informative) Examples of simulated workplace neutron fields Bibliography... Is 2008-All rights reserved ii