International ISO Standard ISO 24173 Microbeam analysis Guidelines Second edition for orientation measurement using 2024-02 electron backscatter diffraction Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés Referencenumber ISO 24173:2024(en) @ ISO 2024 IS0 24173:2024(en) COPYRIGHT PROTECTED DOCUMENT CIS02024 All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below orIso's memberbody inthe countryofthe requester. ISO copyright office CP 40i:Ch.de Blandonnet 8 CH-1214 Vernier, Geneva Phone: +41 22 749 01 11 Email:[email protected] Website: www.iso.org Published in Switzerland @ IS0 2024 - All rights reserved i